Title :
Graphene metrology
Author :
Janssen, T.J.B.M. ; Giusca, C. ; Gallop, J. ; Hao, Liangliang ; Kazakova, Olga ; Panchal, V. ; Pearce, Roger ; Tzalenchuk, A.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
We present details of different characterisation techniques for graphene with the aim of linking morphology and functional properties in a quantitative and reproducible way. Rapid non-invasive quality control is essential for industrial production of large quantities of this material.
Keywords :
electrical conductivity measurement; graphene; joining processes; microwave materials; microwave measurement; quality control; C; functional property; graphene metrology; industrial production; linking morphology; noncontact microwave conductivity measurement; rapid noninvasive quality control; Conductivity; Graphene; Metrology; Microwave measurement; Resistance; Silicon carbide; Substrates; Graphene; graphene morphology; graphene topography; measurement standards; quantum Hall effect;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898559
