• DocumentCode
    2365828
  • Title

    Reliable high temperature (70C) high brightness Al-free 980 nm broad area lasers with nonabsorbing mirrors

  • Author

    Kanskar, M. ; Meassick, S. ; Earles, T.

  • Author_Institution
    Alfalight Inc., Madison, WI, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    77
  • Lastpage
    78
  • Abstract
    We report on the successful demonstration of nonabsorbing mirrors in Al-free broad area lasers with reliable operation at 2W and a 70C heatsink temperature. We have used a quantum-well intermixing technique to create nonabsorbing mirrors (NAM) in Al-free broad area lasers. We have life-tested these devices at 2W and a 70C heat sink temperature with virtually no degradation over 2000 hours.
  • Keywords
    brightness; heat sinks; laser mirrors; laser reliability; laser transitions; life testing; optical testing; quantum well lasers; semiconductor device reliability; semiconductor device testing; 2 W; 2000 hour; 70 C; 980 nm; heat sink temperature; life-tested; nonabsorbing mirrors; quantum-well intermixing technique; reliable high temperature high brightness Al-free 980 nm broad area lasers; reliable operation; Brightness; Diode lasers; Laser noise; Mirrors; Optical amplifiers; Power generation; Power lasers; Pump lasers; Quantum well lasers; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Laser Conference, 2002. IEEE 18th International
  • Print_ISBN
    0-7803-7598-X
  • Type

    conf

  • DOI
    10.1109/ISLC.2002.1041126
  • Filename
    1041126