DocumentCode
2365921
Title
Efficient allocation of testing resources for software module testing based on the hyper-geometric distribution software reliability growth model
Author
Hou, Rong-Huei ; Kuo, Sy-Yen ; Chang, Yi-Ping
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
1996
fDate
30 Oct-2 Nov 1996
Firstpage
289
Lastpage
298
Abstract
A considerable amount of testing resources is required during software module testing. In this paper, based on the HGDM (Hyper-Geometric Distribution Model) software reliability growth model, we investigate the following optimal resource allocation problems in software module testing: (1) minimization of the number of software faults still undetected in the system after testing given a total amount of testing resources, and (2) minimization of the total amount of testing resources repaired, given the number of software faults still undetected in the system after testing. Furthermore, based on the concepts of “average allocation” and “proportional allocation”, two simple allocation methods are also introduced. Experimental results show that the optimal allocation method can improve the quality and reliability of the software system much more significantly than these simple allocation methods can. Therefore, the optimal allocation method is very efficient for solving the testing resource allocation problem
Keywords
minimisation; probability; program testing; resource allocation; software quality; software reliability; subroutines; average allocation; hypergeometric distribution software reliability growth model; optimal resource allocation problems; proportional allocation; repaired resources minimization; software module testing; software quality; testing resource allocation; undetected software fault minimization; Application software; Fault detection; Logistics; Project management; Quality management; Resource management; Software reliability; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1996. Proceedings., Seventh International Symposium on
Conference_Location
White Plains, NY
Print_ISBN
0-8186-7707-4
Type
conf
DOI
10.1109/ISSRE.1996.558884
Filename
558884
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