DocumentCode :
236596
Title :
Manganese nitride compound standard resistor
Author :
Oe, Takehiko ; Urano, Chiharu ; Kaneko, Naoya ; Eisaki, Hiroshi ; Yoshida, Yutaka ; Yamamoto, Akiyasu ; Takenaka, Kana
Author_Institution :
Nat. Metrol. Inst. of Japan, Tsukuba, Japan
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
692
Lastpage :
693
Abstract :
The manganese nitride antiperovskite compound, Mn3Ag1-xCuxN shows broad resistivity-temperature curve around room temperature. This curvature and the peak temperature can be adjusted by In or Fe doping. The drift-rate of the resistance value was strongly affected by the condition of the 4-terminal contact and the shape of the sample. The sample with 4-terminal shape shows 90 times lower drift rate of resistance than the normal cuboid shape sample. We confirmed that the Mn3AgN sample shows low enough thermal electromotive force against copper less than a few μV/K. We expect that this antiperovskite compound can be used as a material of precision resistors and has a possibility to improve the temperature coefficient of resistors including the purpose for standards.
Keywords :
contact potential; copper compounds; manganese compounds; resistors; silver compounds; 4-terminal contact; 4-terminal shape; Mn3Ag1-xCuxN; manganese nitride antiperovskite compound; resistivity-temperature curve; standard resistor; temperature 293 K to 298 K; temperature coefficient; thermal electromotive force; Compounds; Manganese; Plasma temperature; Resistance; Resistors; Shape; Temperature measurement; Antiperovskite compound; Mn3AgCuN; Seebeck coefficient; aging rate; standard resistor; temperature coefficient; thermal electromotive force against copper;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898574
Filename :
6898574
Link To Document :
بازگشت