• DocumentCode
    2365988
  • Title

    Logical circuit gate sizing using MPSO guided by Logical Effort - An examination of the 4-stage half adder circuit

  • Author

    Johari, A. ; Mohamed, S. ; Halim, A.K. ; Yassin, I.M. ; Hassan, H.A.

  • Author_Institution
    Fac. of Electr. Eng., Univ. Teknol. Mara, Shah Alam, Malaysia
  • fYear
    2011
  • fDate
    25-27 April 2011
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    Automated Complementary Metal Oxide Semiconductor (CMOS) logic circuit design leads to the reduction in costs associated with manpower and manufacturing time. Conventional methods use repetitive manual testing guided by Logical Effort (LE). LE provides an easy way to compare and select circuit topologies, choose the best number of stages for path and estimate path delay. In this paper, we propose the Mutative Particle Swarm Optimization (MPSO) algorithm as a method to automate the process of CMOS circuit design by approaching the design process as an optimization problem. In our work, we choose gate widths inside the circuit as parameters to be optimized in order to achieve the target delay, and its fitness is guided by the LE method. Various parameters, such as swarm size and iterations were tested under different initialization conditions to verify MPSO´s performance on a 4-stage half-adder circuit. Results have indicated that the MPSO algorithm was an effective method to apply to the circuit design problem, with high convergence rates observed.
  • Keywords
    CMOS logic circuits; adders; logic design; particle swarm optimisation; 4-stage half adder circuit; LE method; MPSO; MPSO algorithm; automated CMOS logic circuit design; automated complementary metal oxide semiconductor logic circuit design; logical circuit gate sizing; logical effort method; mutative particle swarm optimization algorithm; optimization problem; repetitive manual testing; Adders; Capacitance; Delay; Logic gates; Optimization; Particle swarm optimization; Transistors; Automated circuit design; Logical Effort; Particle swarm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Devices, Systems and Applications (ICEDSA), 2011 International Conference on
  • Conference_Location
    Kuala Lumpur
  • ISSN
    2159-2047
  • Print_ISBN
    978-1-61284-388-9
  • Type

    conf

  • DOI
    10.1109/ICEDSA.2011.5959102
  • Filename
    5959102