DocumentCode :
2366005
Title :
One-step commutation in voltage source inverters using pulse wire sensor based current sign detection
Author :
Krauss, Sebastian ; Hofmann, Wilfried
Author_Institution :
Chemnitz Univ. of Technol., Chemnitz
fYear :
2007
fDate :
26-28 Sept. 2007
Firstpage :
1
Lastpage :
8
Abstract :
The dead-time effect, known as one of the basic problems in dc/ac and ac/ac power conversion, has been investigated over a long period. Varying methods based on the elimination, respectively the reduction of the dead-time effect were proposed over the last years. The main idea, beside the reduction of the semiconductor switching times, is to compensate the impact by adding the averaged dead-time error-voltage to the reference voltage. A more feasible approach is based on the knowledge of the according phase current polarity, whereas only those semiconductors are active switched, which are able to conduct the current in the actual direction. The resulting commutation strategy, known as one-step commutation, promises appreciable improvements concerning the quality of current and voltage waveforms. Beside conventional current measurement methods, a novel robust current sign detection approach, based on pulse wire sensors is presented in this paper. A first implementation of the measuring strategy is demonstrated, taking a common voltage source inverter, controlled by a standard space vector modulation and an one-step commutation algorithm in a simulation environment.
Keywords :
AC-AC power convertors; DC-AC power convertors; invertors; ac-ac power conversion; averaged dead-time error-voltage; current measurement methods; current sign detection; dc-ac power conversion; dead-time effect; one-step commutation; phase current polarity; pulse wire sensor; robust current sign detection approach; semiconductor switching times; space vector modulation; voltage source inverters; Current measurement; Extraterrestrial measurements; Measurement standards; Power conversion; Power semiconductor switches; Pulse inverters; Pulse measurements; Robustness; Voltage control; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AFRICON 2007
Conference_Location :
Windhoek
Print_ISBN :
978-1-4244-0987-7
Electronic_ISBN :
978-1-4244-0987-7
Type :
conf
DOI :
10.1109/AFRCON.2007.4401638
Filename :
4401638
Link To Document :
بازگشت