• DocumentCode
    2366019
  • Title

    Metric Based Multi-Timescale Control for Reducing Power in Embedded Systems

  • Author

    Kataria, Nitin ; Brewer, Forrest ; Hespanha, Joáo ; Sherwood, Timothy

  • Author_Institution
    Univ. of California, Santa Barbara, CA
  • fYear
    2009
  • fDate
    5-9 Jan. 2009
  • Firstpage
    407
  • Lastpage
    412
  • Abstract
    Digital control for embedded systems often requires low-power, hard real-time computation to satisfy high control-loop bandwidth, low latency, and low-power requirements. In particular, the emerging applications of micro electro-mechanical systems (MEMS) sensors, and their increasing integration, presents a challenging requirement to embed ultra-low power digital control architectures for these lithographically formed micro-structures. Controlling electromechanical structures of such a small scale, using naive digital controllers, can be prohibitively expensive (both in power and cost for portable or battery operated applications.) In this paper, we describe the potential for control systems to be transformed into a set of co-operating parallel linear systems and demonstrate, for the first time, that this parallelization can reduce the total number of instructions executed, thereby reducing power, at the expense of controlled loss in control fidelity. Since the error tolerance of linear feedback control systems is mathematically well-posed, this technique opens up a new, independent dimension for system optimization. We present a novel computer-aided design (CAD) method to evaluate control fidelity, with varying timescales on the controller, and analyze the trade-off between performance and power dissipation. A CAD Metric for control fidelity is proposed and we demonstrate the potential for power savings using this decomposition on two different control problems.
  • Keywords
    digital control; electronic design automation; embedded systems; feedback; lithography; low-power electronics; optimisation; computer-aided design; control-loop bandwidth; embedded systems; error tolerance; linear feedback control systems; lithography; low-power requirements; micro electro-mechanical systems sensors; microstructures; multitimescale control; parallel linear systems; system optimization; ultra-low power digital control architectures; Bandwidth; Control systems; Delay; Design automation; Digital control; Electromechanical sensors; Embedded computing; Embedded system; Micromechanical devices; Real time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2009 22nd International Conference on
  • Conference_Location
    New Delhi
  • ISSN
    1063-9667
  • Print_ISBN
    978-0-7695-3506-7
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2009.16
  • Filename
    4749707