DocumentCode :
2366021
Title :
Trench-IGBTs with integrated diverter structures
Author :
Constapel, Rainer ; Korec, Jacek ; Baliga, B.J.
Author_Institution :
Res. Inst., Daimler-Benz AG, Frankfurt, Germany
fYear :
1995
fDate :
23-25 May 1995
Firstpage :
201
Lastpage :
206
Abstract :
Improved trench-IGBT structures are proposed and discussed in this paper by introducing a p+-diverter region at the bottom of the trench. This improves the reliability of the device by relaxing the electrical field at the corner of the trench and diverts holes from entering the p-base region during forward conduction and, what is more important, during switching. The performed numerical analysis for structures with a diverter connected to the cathode either via a linear resistor or a p-n diode shows, that the device with a diode diverter exhibits a significant improvement of the device performance as compared with the conventional trench-IGBT. The most important result is the excellent safe operating area of the proposed device
Keywords :
insulated gate bipolar transistors; power semiconductor switches; power transistors; semiconductor device reliability; 600 V; device SOA; diode diverter; electrical field; forward conduction; integrated diverter structures; numerical analysis; p-base region; p+-diverter region; reliability improvement; safe operating area; switching; trench IGBT; Anodes; Cathodes; Current density; Doping; Insulated gate bipolar transistors; Low voltage; Numerical analysis; Resistors; Semiconductor diodes; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1995. ISPSD '95., Proceedings of the 7th International Symposium on
Conference_Location :
Yokohama
ISSN :
1063-6854
Print_ISBN :
0-7803-2618-0
Type :
conf
DOI :
10.1109/ISPSD.1995.515035
Filename :
515035
Link To Document :
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