DocumentCode
2366021
Title
Trench-IGBTs with integrated diverter structures
Author
Constapel, Rainer ; Korec, Jacek ; Baliga, B.J.
Author_Institution
Res. Inst., Daimler-Benz AG, Frankfurt, Germany
fYear
1995
fDate
23-25 May 1995
Firstpage
201
Lastpage
206
Abstract
Improved trench-IGBT structures are proposed and discussed in this paper by introducing a p+-diverter region at the bottom of the trench. This improves the reliability of the device by relaxing the electrical field at the corner of the trench and diverts holes from entering the p-base region during forward conduction and, what is more important, during switching. The performed numerical analysis for structures with a diverter connected to the cathode either via a linear resistor or a p-n diode shows, that the device with a diode diverter exhibits a significant improvement of the device performance as compared with the conventional trench-IGBT. The most important result is the excellent safe operating area of the proposed device
Keywords
insulated gate bipolar transistors; power semiconductor switches; power transistors; semiconductor device reliability; 600 V; device SOA; diode diverter; electrical field; forward conduction; integrated diverter structures; numerical analysis; p-base region; p+-diverter region; reliability improvement; safe operating area; switching; trench IGBT; Anodes; Cathodes; Current density; Doping; Insulated gate bipolar transistors; Low voltage; Numerical analysis; Resistors; Semiconductor diodes; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 1995. ISPSD '95., Proceedings of the 7th International Symposium on
Conference_Location
Yokohama
ISSN
1063-6854
Print_ISBN
0-7803-2618-0
Type
conf
DOI
10.1109/ISPSD.1995.515035
Filename
515035
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