• DocumentCode
    2366021
  • Title

    Trench-IGBTs with integrated diverter structures

  • Author

    Constapel, Rainer ; Korec, Jacek ; Baliga, B.J.

  • Author_Institution
    Res. Inst., Daimler-Benz AG, Frankfurt, Germany
  • fYear
    1995
  • fDate
    23-25 May 1995
  • Firstpage
    201
  • Lastpage
    206
  • Abstract
    Improved trench-IGBT structures are proposed and discussed in this paper by introducing a p+-diverter region at the bottom of the trench. This improves the reliability of the device by relaxing the electrical field at the corner of the trench and diverts holes from entering the p-base region during forward conduction and, what is more important, during switching. The performed numerical analysis for structures with a diverter connected to the cathode either via a linear resistor or a p-n diode shows, that the device with a diode diverter exhibits a significant improvement of the device performance as compared with the conventional trench-IGBT. The most important result is the excellent safe operating area of the proposed device
  • Keywords
    insulated gate bipolar transistors; power semiconductor switches; power transistors; semiconductor device reliability; 600 V; device SOA; diode diverter; electrical field; forward conduction; integrated diverter structures; numerical analysis; p-base region; p+-diverter region; reliability improvement; safe operating area; switching; trench IGBT; Anodes; Cathodes; Current density; Doping; Insulated gate bipolar transistors; Low voltage; Numerical analysis; Resistors; Semiconductor diodes; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1995. ISPSD '95., Proceedings of the 7th International Symposium on
  • Conference_Location
    Yokohama
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-2618-0
  • Type

    conf

  • DOI
    10.1109/ISPSD.1995.515035
  • Filename
    515035