Title :
Simultaneous Peak Temperature and Average Power Minimization during Behavioral Synthesis
Author :
Krishnan, Vyas ; Katkoori, Srinivas
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL
Abstract :
With continuous CMOS scaling and increasing operating frequencies, power and thermal concerns have become critical design issues in current and future high-performance integrated circuits. Elevated chip temperatures adversely impact circuit performance and reliability. On-chip thermal gradients can lead to unpredictable clock skew variations and timing failures. Chip temperatures are influenced by design decisions at the behavioral and physical-synthesis levels. Existing low-power design techniques cannot adequately address thermal issues since their optimization objectives fail to capture the spatial nature of on-chip thermal gradients. We present an algorithm for thermally-aware low-power behavioral synthesis that concurrently minimizes average power and peak chip temperature. Our algorithm uses accurate floorplan-based temperature estimates to guide behavioral synthesis. Compared to traditional low-power synthesis, our method reduces peak temperatures by as much as 23%, with less than 10% overhead in chip area.
Keywords :
CMOS integrated circuits; VLSI; chip scale packaging; circuit optimisation; electronic engineering computing; estimation theory; integrated circuit layout; integrated circuit modelling; minimisation; thermal management (packaging); CMOS technology; VLSI circuit; average power minimization; floorplan-based temperature estimates; peak chip temperature minimization; thermal management; thermally-aware low-power behavioral synthesis; CMOS integrated circuits; Circuit optimization; Clocks; Design optimization; Frequency; Integrated circuit reliability; Integrated circuit synthesis; Minimization; Temperature; Timing; Behavioral synthesis; High-Level synthesis; Low-power; Power minimization; Power optimization; Temperature-aware synthesis;
Conference_Titel :
VLSI Design, 2009 22nd International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-0-7695-3506-7
DOI :
10.1109/VLSI.Design.2009.78