DocumentCode
2366238
Title
Built in Self Test Based Design of Wave-Pipelined Circuits in ASICs
Author
Vireen, V. ; Venugopalachary, N. ; Seetharaman, G. ; Venkataramani, B.
Author_Institution
Nat. Inst. of Technol., Trichy
fYear
2009
fDate
5-9 Jan. 2009
Firstpage
473
Lastpage
478
Abstract
Wave-pipelining enables digital systems to be operated at higher frequencies by properly selecting the clock periods and clock skews so as to latch the output of combinational logic circuits at stable periods. In the literature, only trial and error and manual procedures are adopted for these selections. The major contribution of this paper is the proposal for automating the above procedure for the ASIC implementation of wave pipelined circuits using built in self test approach. For the purpose of verification, a Coordinate rotation digital computer and filters using the distributed arithmetic algorithm are implemented. To test the efficacy, these circuits are implemented by adopting three schemes: wave-pipelining, pipelining and non-pipelining. From the implementation results, it is observed that the wave-pipelined circuits are 21-29% faster compared to non-pipelined circuits. The pipelined circuits are 22-48% faster compared to wave-pipelined circuits but at the cost of about 18-28% increase in area.
Keywords
VLSI; application specific integrated circuits; combinational circuits; digital filters; distributed algorithms; high-speed integrated circuits; integrated circuit design; pipeline arithmetic; ASIC implementation; combinational logic circuits; coordinate rotation digital computer; distributed arithmetic algorithm; filters; nonpipelined circuits; wave-pipelined circuits; Application specific integrated circuits; Automatic testing; Circuit testing; Clocks; Combinational circuits; Computer errors; Digital systems; Frequency; Latches; Proposals; ASIC; BIST; DAA; FSM; PRSG; Wave-pipelining;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2009 22nd International Conference on
Conference_Location
New Delhi
ISSN
1063-9667
Print_ISBN
978-0-7695-3506-7
Type
conf
DOI
10.1109/VLSI.Design.2009.46
Filename
4749717
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