DocumentCode
2366392
Title
Recommendations to further improvements of HBM ESD component level test specifications
Author
Verhaege, Koen ; Russ, Christian ; Robinson-Hahn, Donna ; Farris, Marti ; Scanlon, Jeff ; Lin, Don ; Veltri, Joseph ; Groeseneken, Guido
Author_Institution
David Sarnoff Res. Center, Princeton, NJ, USA
fYear
1996
fDate
10-12 Sept. 1996
Firstpage
40
Lastpage
53
Abstract
The goal of this paper is to provide data and discussion to help the ESD testing community come to a single and improved HBM ESD component level testing standard. The differences in the ESD Association and the JEDEC HBM testing procedures (∼qualification) and tester specifications (∼test result reproducibility) are investigated. A reduction of the test time-and thus cost-by a factor of 30 to ultimately 300, is addressed and justified. A future issue, the definition of HBM waveform envelopes to replace HBM waveform specifications, is addressed and a viable solution is offered.
Keywords
electrostatic discharge; standards; testing; ESD Association; HBM ESD component level testing standard; JEDEC; qualification; reproducibility; waveform envelope; Electrostatic discharges; Standards; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 1996. Proceedings
Print_ISBN
1-878303-69-4
Type
conf
DOI
10.1109/EOSESD.1996.865125
Filename
865125
Link To Document