Title :
CDM ESD test considered phenomena of division and reduction of high voltage discharge in the environment
Author :
Tanaka, Masaki ; Okada, Koji
Author_Institution :
Semicond. & Integrated Circuits Div., Hitachi Ltd., Tokyo, Japan
Abstract :
It is well known that devices laying on the ground plane of CDM testers are more susceptible to CDM damage because their capacitances are increased quantities of electric charge are also increased. But real-life CDM events in the environment are opposite to tendencies of CDM tests. In real-life, charging of devices occurs by friction or static induction and capacitances of devices don´t influence quantities of electric charge on devices. And the capacitance influences voltage of gap between pins of devices and conductive materials, the voltage become lower when devices are laying on any conductive material because quantities of electric charge of Q until discharge are constant and electric potentials of V derived from equation V=Q/C are variable. Thus we researched high voltage CDM discharges on small capacitances to perform right CDM test because capacitances of inclining position of devices become smaller and their voltages become over 1000 V. Then we found out new phenomena on high voltage aerial discharges.
Keywords :
corona; electrostatic discharge; high-voltage techniques; testing; 1000 V; CDM ESD testing; capacitance; corona discharge; device charging; electric potential; friction; high voltage aerial discharge; static induction; Corona; Electrostatic discharges; High-voltage techniques; Testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 1996. Proceedings
Print_ISBN :
1-878303-69-4
DOI :
10.1109/EOSESD.1996.865126