• DocumentCode
    2366438
  • Title

    Optimisation Quality Assessment in Large, Complex SoC Designs Challenges and Solutions

  • Author

    Venkatraman, R. ; Pundoor, Shrikrishna ; Koithyar, Arun ; Rao, Madhusudan ; Rao, Jagdish C.

  • Author_Institution
    Texas Instrum. India Ltd., Bangalore
  • fYear
    2009
  • fDate
    5-9 Jan. 2009
  • Firstpage
    525
  • Lastpage
    530
  • Abstract
    Design optimisation of large system-on-chip (SoC) designs presents significant challenges in terms of the number of care-abouts in today´s chip design scenario. While optimisation approaches have focused on key aspects like design timing, power and routability, there are several critical aspects that do not get modelled by the abstraction approaches used in current solutions, resulting in local areas of potentially bad quality of results (QoR). The definition of design quality metrics for assessing various aspects of interest thus comes out as a key requirement in designs today. In this paper, we highlight the key challenges in the design of large, complex SoCs and propose some design metrics that identify problem areas for improvement. We highlight how conventional abstraction schemes tend to mask such problems when looking at design-level averaging for the relevant cost-functions. We present the results of these metrics and also show why not resolving some of these potential bottle-necks could lead to significant challenges in overall design closure.
  • Keywords
    system-on-chip; SoC designs; abstraction schemes; cost-functions; design timing; quality assessment optimisation; quality of results; system-on-chip; Algorithm design and analysis; Chip scale packaging; Design optimization; Instruments; Phase estimation; Power system modeling; Quality assessment; System-on-a-chip; Timing; Very large scale integration; Optimisation; QoR assessment; metrics; physical design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2009 22nd International Conference on
  • Conference_Location
    New Delhi
  • ISSN
    1063-9667
  • Print_ISBN
    978-0-7695-3506-7
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2009.52
  • Filename
    4749725