DocumentCode
2366438
Title
Optimisation Quality Assessment in Large, Complex SoC Designs Challenges and Solutions
Author
Venkatraman, R. ; Pundoor, Shrikrishna ; Koithyar, Arun ; Rao, Madhusudan ; Rao, Jagdish C.
Author_Institution
Texas Instrum. India Ltd., Bangalore
fYear
2009
fDate
5-9 Jan. 2009
Firstpage
525
Lastpage
530
Abstract
Design optimisation of large system-on-chip (SoC) designs presents significant challenges in terms of the number of care-abouts in today´s chip design scenario. While optimisation approaches have focused on key aspects like design timing, power and routability, there are several critical aspects that do not get modelled by the abstraction approaches used in current solutions, resulting in local areas of potentially bad quality of results (QoR). The definition of design quality metrics for assessing various aspects of interest thus comes out as a key requirement in designs today. In this paper, we highlight the key challenges in the design of large, complex SoCs and propose some design metrics that identify problem areas for improvement. We highlight how conventional abstraction schemes tend to mask such problems when looking at design-level averaging for the relevant cost-functions. We present the results of these metrics and also show why not resolving some of these potential bottle-necks could lead to significant challenges in overall design closure.
Keywords
system-on-chip; SoC designs; abstraction schemes; cost-functions; design timing; quality assessment optimisation; quality of results; system-on-chip; Algorithm design and analysis; Chip scale packaging; Design optimization; Instruments; Phase estimation; Power system modeling; Quality assessment; System-on-a-chip; Timing; Very large scale integration; Optimisation; QoR assessment; metrics; physical design;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2009 22nd International Conference on
Conference_Location
New Delhi
ISSN
1063-9667
Print_ISBN
978-0-7695-3506-7
Type
conf
DOI
10.1109/VLSI.Design.2009.52
Filename
4749725
Link To Document