• DocumentCode
    2366446
  • Title

    A conservative theory for long term reliability growth prediction

  • Author

    Bishop, P.G. ; Bloomfield, Robin E.

  • Author_Institution
    Adelard, London, UK
  • fYear
    1996
  • fDate
    30 Oct-2 Nov 1996
  • Firstpage
    308
  • Lastpage
    317
  • Abstract
    The paper describes a different approach to software reliability growth modelling which should enable conservative long term predictions to be made. Using relatively standard assumptions it is shown that the expected value of the failure rate after a usage time t is bounded by: λ¯t⩽(N/(et)) where N is the initial number of faults and e is the exponential constant. This is conservative since it places a worst case bound on the reliability rather than making a best estimate. We also show that the predictions might be relatively insensitive to assumption violations over the longer term. The theory offers the potential for making long term software reliability growth predictions based solely on prior estimates of the number of residual faults. The predicted bound appears to agree with a wide range of industrial and experimental reliability data. It is shown that less pessimistic results can be obtained if additional assumptions are made about the failure rate distribution of faults
  • Keywords
    forecasting theory; probability; software performance evaluation; software quality; software reliability; assumption violations; conservative long term predictions; conservative theory; expected value; exponential constant; failure rate; failure rate distribution; long term reliability growth prediction; long term software reliability growth predictions; predicted bound; prior estimates; residual faults; standard assumptions; worst case bound; Fault detection; Hydrogen; Predictive models; Reliability theory; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1996. Proceedings., Seventh International Symposium on
  • Conference_Location
    White Plains, NY
  • Print_ISBN
    0-8186-7707-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.1996.558887
  • Filename
    558887