Microvolt Josephson voltage set-up based on two programmable Josephson arrays

Author

Honghui Li ; Yuan Gao ; Zengmin Wang

Author_Institution

Nat. Inst. of Metrol., Beijing, China

fYear

2014

fDate

24-29 Aug. 2014

Firstpage

744

Lastpage

745

Abstract

This paper presents an automated microvolt Josephson voltage set-up developed at NIM. It is based on two programmable Josephson SINIS arrays, and can be used to calibrate the lower ranges of nanovoltmeters for low level DC measurements. A low noise bias source developed at NIM has been used and the step flatness of the arrays was verified carefully. The preliminary results of the measurements set at 3 μV show that the difference between the measured values and the theoretical value is 0.03 nV with the uncertainty (k = 1) of 0.10 nV.

Keywords

Josephson effect; calibration; electric current measurement; measurement uncertainty; surface topography measurement; voltage measurement; voltmeters; NIM; automated microvolt Josephson voltage set-up; calibration; low level DC measurement; low noise bias source; measurement uncertainty; nanovoltmeter; programmable Josephson SINIS array; step flatness; voltage 0.03 nV; voltage 0.10 nV; Calibration; Current measurement; Josephson junctions; Junctions; Measurement uncertainty; Uncertainty; Voltage measurement; DC voltage calibration; Programmable Josephson array; low level measurement; microvolt;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on

Conference_Location

Rio de Janeiro

ISSN

0589-1485

Print_ISBN

978-1-4799-5205-2

Type

conf

DOI

10.1109/CPEM.2014.6898600

Filename

6898600