DocumentCode :
2366474
Title :
Exploring the Limits of Port Reduction in Centralized Register Files
Author :
Sirsi, Sandeep ; Aggarwal, Aneesh
Author_Institution :
Electr. & Comput. Eng. Dept., Binghamton Univ., Binghamton, NY
fYear :
2009
fDate :
5-9 Jan. 2009
Firstpage :
535
Lastpage :
540
Abstract :
Register file access falls on the critical path of a microprocessor because large heavily ported register files are used to exploit more parallelism. In this paper, we focus on reducing register file complexity by reducing the number of register file read ports. The goal of this paper is to explore the limits of read port reduction in a centralized integer register file i.e. how few read ports can be provided to a centralized integer register file, while still maintaining performance? A naive port reduction may result in significant performance degradation and does not give a true measure of the limits, while clever techniques may be able to further reduce the number of ports. Hence, in this paper, we drastically reduce the number of ports and then investigate techniques to improve the performance of the reduced-ported register file. Our experiments show that the techniques allow further port reduction by improving the performance from reduced-ported RFs. For instance, with our experimental parameters, the naive port reduction method requires at least five read ports to maintain a performance impact of less than 5%, whereas, our techniques require only three ports.
Keywords :
file organisation; microprocessor chips; centralized register files; complexity reduction; microprocessor; read port reduction; Clocks; Concurrent computing; Degradation; Design engineering; Microprocessors; Parallel processing; Processor scheduling; Radio frequency; Registers; Very large scale integration; Complexity-effective design; Instructions per cycle; Port reduction; Register file;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2009 22nd International Conference on
Conference_Location :
New Delhi
ISSN :
1063-9667
Print_ISBN :
978-0-7695-3506-7
Type :
conf
DOI :
10.1109/VLSI.Design.2009.29
Filename :
4749727
Link To Document :
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