• DocumentCode
    2366512
  • Title

    Multifractal Spectrum Analysis on Microscope Image of Eutectic Carbides by a Quadratic Function Fitting

  • Author

    Wang, Guitang ; Ning, Jing ; Zhang, Qiaofen ; Liu, Wenjuan ; Tang, Luxin

  • Author_Institution
    Sch. of Inf. Eng., GuangDong Univ. of Technol., Guangzhou, China
  • fYear
    2009
  • fDate
    25-27 Aug. 2009
  • Firstpage
    1623
  • Lastpage
    1627
  • Abstract
    Multifractal is employed to analyze standard atlas of the distribution of degree 1~8 eutectic carbides in alloy. We do a research on relationship between partition function & forming element, and multifractal spectrum & singularity. Graph of partition function & forming element presents a favorable linear in the condition of weighting factor q>0 or q<0, which proves that the distribution of eutectic carbides has character of scaling invariability in the range of 0 and 50 as ideal fractal; Graph of multifractal spectrum & singularity presents bell-shaped or hooked, and the narrower the shape is, the more symmetrical the distribution of eutectic carbides is; and vice versa. We also finds the coefficients of a polynomial multifractal spectrum of degree 2 that fits singularity, which provides eigenvalues to make advanced research on pattern recognition of degree 1~8 eutectic carbides.
  • Keywords
    eigenvalues and eigenfunctions; fractals; image processing; polynomials; spectral analysis; eigenvalues; eutectic carbides; forming element; microscope image; multifractal spectrum analysis; partition function; pattern recognition; polynomial multifractal spectrum; quadratic function fitting; scaling invariability; weighting factor; Eigenvalues and eigenfunctions; Fractals; Image analysis; Information analysis; Microscopy; Pattern recognition; Polynomials; Probability distribution; Shape; Steel; eutectic carbides; multifractal spectrum; quadratic function; scaling invariability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INC, IMS and IDC, 2009. NCM '09. Fifth International Joint Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-5209-5
  • Electronic_ISBN
    978-0-7695-3769-6
  • Type

    conf

  • DOI
    10.1109/NCM.2009.291
  • Filename
    5331761