DocumentCode
2366535
Title
Tutorial: Power-aware, reliable microprocessor design
Author
Bose, Pradip
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2005
fDate
3-7 Jan. 2005
Firstpage
3
Abstract
Summary form only given. In this tutorial, we present the foundational principles and methodologies behind the design of power-efficient, reliable microprocessors. The stress is on early-stage (pre-RTL) definition at the micro-architecture level, although relevant details from lower levels of design (e.g. logic, circuits and below) are also covered where appropriate. We first cover the topic of pre-silicon modeling to estimate performance, power, temperature and reliability, in the context of target workloads of interest to the design team. We then delve into the definition of the optimal pipeline depth for a microprocessor: a task that is one of the basic initial decisions faced by the design team. Subsequently, we cover the topic of adaptive micro-architectures: those that are designed to change with variations in the workload, with the goal of maximizing power-performance efficiency, reliability, or both. We address both active (or dynamic) and passive (or static) power in presenting evaluations of various micro-architectural techniques for power management.
Keywords
integrated circuit design; integrated circuit reliability; logic design; microprocessor chips; power consumption; active power; adaptive micro-architecture; dynamic power; early-stage definition; microarchitecture level; optimal pipeline depth; passive power; power management; power-aware microprocessor design; power-efficient microprocessors; preRTL definition; presilicon modeling; reliable microprocessor design; static power; target workloads; workload variations; Context modeling; Design methodology; Energy management; Logic circuits; Logic design; Microprocessors; Pipelines; Stress; Temperature; Tutorial;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2005. 18th International Conference on
Conference_Location
Kolkata, India
ISSN
1063-9667
Print_ISBN
0-7695-2264-5
Type
conf
DOI
10.1109/ICVD.2005.142
Filename
1383234
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