DocumentCode :
2366629
Title :
Surface Profiling Using a Modified Shadow Moir é Technique
Author :
Zhao, R. ; Lu, H. ; Zhou, M. ; Sun, C.
Author_Institution :
Dept. of Mech. & Ind. Eng., Ryerson Univ., Toronto, Ont.
fYear :
2006
fDate :
15-17 March 2006
Firstpage :
151
Lastpage :
154
Abstract :
The paper presents a modified shadow moire system that improves the surface profile measurement in accuracy, efficiency and convenience. First, the new system incorporates a multigrid least-square unwrapping algorithm in conjunction with phase-shifting technique. Furthermore, the current system incorporates a contour detection technique in fringe processing to facilitate the measurement in non-rectangular or irregular shaped surfaces and hollow areas. A new system calibration approach is also implemented based on a real-time image subtraction scheme
Keywords :
image processing; moire fringes; optical information processing; surface topography measurement; contour detection; fringe processing; multigrid least-square unwrapping; real-time image subtraction; shadow moire system; surface profile measurement; Displacement measurement; Geometry; Glass; Gratings; Interference; Light sources; Lighting; Observatories; Optical collimators; Optical sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interface, 200611th International Symposium on
Conference_Location :
Atlanta, GA
ISSN :
1550-5723
Print_ISBN :
1-4244-0260-3
Type :
conf
DOI :
10.1109/ISAPM.2006.1666030
Filename :
1666030
Link To Document :
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