Reliability proving of 980 nm pump lasers for metro applications

Author

Arlt, S. ; Pfeiffer, Hans-Ulrich ; Jung, Lsabella D. ; Jakubowicz, Abram ; Schwarz, Michael ; Matuschek, Nicolai ; Pliska, Tomas ; Schmidt, Berthold ; Mohrdiek, Stefan ; Harder, Christoph S.

Author_Institution

Nortel Networks Opt. Components GmbH, Zurich, Switzerland

fYear

2002

fDate

2002

Firstpage

167

Lastpage

168

Abstract

Reliability testing of pump lasers is based on accelerated life tests with different stress conditions. These tests are well established and their underlying principle is the scaling of the device lifetime with different stress conditions. The stress conditions have to be chosen in such a way that the aging of the laser chip is accelerated but no additional aging effects compared to operating conditions are induced. If the scaling factor is known the device lifetime at operating conditions can be calculated.

Keywords

ageing; laser transitions; life testing; metropolitan area networks; optical communication equipment; optical pumping; optical testing; semiconductor device reliability; semiconductor device testing; semiconductor lasers; 980 nm; 980 nm pump lasers; accelerated life tests; device lifetime; laser chip aging; laser diodes; metro applications; operating conditions; reliability testing; scaling factor; stress conditions; Aging; Laser applications; Laser excitation; Laser modes; Optical microscopy; Power lasers; Pump lasers; Stress; Temperature; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Laser Conference, 2002. IEEE 18th International

Print_ISBN

0-7803-7598-X

Type

conf

DOI

10.1109/ISLC.2002.1041169

Filename

1041169