• DocumentCode
    2366794
  • Title

    Reliability of thick Al wire bonds in IGBT modules for traction motor drives

  • Author

    Onuki, Jin ; Koizumi, Masahiro

  • Author_Institution
    Res. Lab., Hitachi Ltd., Ibaraki, Japan
  • fYear
    1995
  • fDate
    23-25 May 1995
  • Firstpage
    428
  • Lastpage
    433
  • Abstract
    Reliability of thick Al wire bonds during the thermal fatigue test has been investigated from a metallurgical viewpoint. The bond interface between Al wires and Al-Si films was found to be a coincidence boundary or a boundary with very fine grain size, and hence so strong that cracks advanced along the grain boundary of the wire at the bonding interface in the accelerated thermal fatigue test. It was also found that crack growth rate could be reduced considerably by enlarging the grain size at the interface. The hypothesis that bonds would not degrade in actual use of traction motor drives was presented on the basis of the fatigue theory of Al
  • Keywords
    aluminium; cracks; fatigue; grain boundaries; grain size; insulated gate bipolar transistors; interface phenomena; lead bonding; life testing; modules; semiconductor device packaging; semiconductor device reliability; thermal stress cracking; thermal stresses; traction motor drives; Al-AlSi; Al-Si films; IGBT modules; accelerated test; bond interface; crack growth rate; cracks; grain boundary; grain size; reliability; thermal fatigue test; thick Al wire bonds; traction motor drives; Bonding; Fatigue; Grain boundaries; Grain size; Insulated gate bipolar transistors; Life estimation; Testing; Thermal degradation; Traction motors; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1995. ISPSD '95., Proceedings of the 7th International Symposium on
  • Conference_Location
    Yokohama
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-2618-0
  • Type

    conf

  • DOI
    10.1109/ISPSD.1995.515076
  • Filename
    515076