Title :
Proceedings of the Twelfth Asian Symposium, ATS 2003
Abstract :
The following topics are dealt with: design for testability; software testing; mixed-signal testing; test compaction; RTL verification; memory testing; fault diagnosis; delay testing; BIST; ATPG.
Keywords :
automatic test pattern generation; boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; logic testing; program testing; ATPG; BIST; RTL verification; delay testing; design for testability; fault diagnosis; memory testing; mixed-signal testing; software testing; test compaction; Boundary scan testing; Fault diagnosis; Integrated circuit testing; Logic circuit testing; Self-testing; Software testing;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Conference_Location :
Xi´an, China
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250765
