DocumentCode
2366976
Title
Leveraging infrastructure IP for SoC yield
Author
Zorian, Yervant
Author_Institution
Virage Logic Corp., Fremont, CA, USA
fYear
2003
fDate
16-19 Nov. 2003
Firstpage
3
Lastpage
4
Abstract
Summary form only given. In addition to the functional IP cores, today´s SoC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SoC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This keynote address analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. Then, it concentrates on certain examples of such embedded IPs for detection, analysis and correction.
Keywords
industrial property; integrated circuit design; integrated circuit reliability; integrated circuit yield; system-on-chip; SoC yield; analysis IP; correction IP; detection embedded IP; field reliability; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing knowledge feedback; manufacturing susceptibility; Automatic testing; Electronics industry; Fabrication; Feeds; Integrated circuit design; Integrated circuit reliability; Logic; Manufacturing; Production; Prototypes; Semiconductor device manufacture; Semiconductor device reliability; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1951-2
Type
conf
DOI
10.1109/ATS.2003.1250771
Filename
1250771
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