• DocumentCode
    2366976
  • Title

    Leveraging infrastructure IP for SoC yield

  • Author

    Zorian, Yervant

  • Author_Institution
    Virage Logic Corp., Fremont, CA, USA
  • fYear
    2003
  • fDate
    16-19 Nov. 2003
  • Firstpage
    3
  • Lastpage
    4
  • Abstract
    Summary form only given. In addition to the functional IP cores, today´s SoC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SoC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This keynote address analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. Then, it concentrates on certain examples of such embedded IPs for detection, analysis and correction.
  • Keywords
    industrial property; integrated circuit design; integrated circuit reliability; integrated circuit yield; system-on-chip; SoC yield; analysis IP; correction IP; detection embedded IP; field reliability; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing knowledge feedback; manufacturing susceptibility; Automatic testing; Electronics industry; Fabrication; Feeds; Integrated circuit design; Integrated circuit reliability; Logic; Manufacturing; Production; Prototypes; Semiconductor device manufacture; Semiconductor device reliability; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2003. ATS 2003. 12th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1951-2
  • Type

    conf

  • DOI
    10.1109/ATS.2003.1250771
  • Filename
    1250771