مرکز منطقه ای اطلاع رساني علوم و فناوري - Improving test quality of scan-based BIST by scan chain partitioning

DocumentCode :

2367040

Title :

Improving test quality of scan-based BIST by scan chain partitioning

Author :

Xiang, Dong ; Chen, Ming-Jing ; Sun, Jia-Guang ; Fujiwara, Hideo

Author_Institution :

Tsinhua University

fYear :

2003

fDate :

16-19 Nov. 2003

Firstpage :

Lastpage :

Keywords :

Built-in self-test; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Symposium, 2003. ATS 2003. 12th Asian

ISSN :

1081-7735

Print_ISBN :

0-7695-1951-2

Type :

conf

DOI :

10.1109/ATS.2003.1250774

Filename :

1250774

Link To Document :