Exhaustive test of several dependable memory architectures designed by GRAAL tool

Author

Bertuccelli, F. ; Bigongiari, F. ; Brogna, A.S. ; Natale, G. Di ; Prinetto, P. ; Saletti, R.

Author_Institution

Aurelia Microelettronica S.p.A, Navacchio, Italy

fYear

2003

fDate

16-19 Nov. 2003

Firstpage

32

Lastpage

35

Abstract

This paper presents a customizable injection fault system and performance evaluations of dependable memory collars designed by GRAAL tool. The novelty consists in a large number of tests and architecture comparisons which can demonstrate the efficiency and validity of GRAAL and how it helps the designer to experiment the architecture sensitivity and evaluate changes in performances when a particular dependable memory collar is chosen or bypassed. Moreover, a complete test set-tip and real case study where the memory interacts in a complex system is described The system collects information to measure the effects of fault detection and fault tolerance. The hardware is assembled in a configurable test board with a FPGA where are one of several memory wrapper which GRAAL generates and a serial link to receive and send data from an acquisition system. Two commercial Personal Computers interact thought the boards and collect data from the experiment.

Keywords

DRAM chips; SRAM chips; built-in self test; design for testability; embedded systems; fault diagnosis; integrated circuit testing; space vehicle electronics; BIST; DRAM; FPGA device; GRAAL tool; SRAM; complex system; configurable test board; customizable injection fault system; data memory; dependable memory architectures; embedded systems; fault coverage; fault detection; fault tolerance; memory collar; memory testing; performance evaluations; Automatic testing; Built-in self-test; DRAM chips; Design for testability; Electrical fault detection; Encoding; Error correction; Fault detection; Fault diagnosis; Integrated circuit testing; Logic testing; Memory architecture; Random access memory; Read-write memory; SRAM chips; Self-testing; Space vehicle electronics;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2003. ATS 2003. 12th Asian

ISSN

1081-7735

Print_ISBN

0-7695-1951-2

Type

conf

DOI

10.1109/ATS.2003.1250779

Filename

1250779