• DocumentCode
    2367213
  • Title

    An analytic potential-based model for undoped nanoscale surrounding-gate MOSFETs

  • Author

    Bian, Wei ; He, Jin ; Tao, Yadong ; Fang, Min ; Feng, Jie

  • Author_Institution
    Shenzhen Grad. Sch., Sch. of Comput. & Inf. Eng., Peking Univ., Beijing
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    509
  • Lastpage
    514
  • Abstract
    An analytic potential-based model for the undoped surrounding-gate MOSFETs is derived in the paper. The model is obtained from solving Poisson equation rigorously together with the drain current formulation equivalent to Pao-Sahpsilas double integral previously proposed for long-charnel bulk MOSFETs. The model gives a fully self-consistent physical description for the channel potential, charge and current that is valid for the sub threshold, linear and saturation regions. The validity of the proposed model has been verified by extensive comparison with the exact numerical integrations and 3-D numerical simulation , demonstrating the modelpsilas accuracy and prediction capability.
  • Keywords
    MOSFET; nanotechnology; 3-D numerical simulation; Pao-Sahpsilas double integral; Poisson equation; channel potential; drain current formulation; self-consistent physical description; undoped nanoscale surrounding-gate MOSFETs; MOSFETs; Nanoelectronics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1572-4
  • Electronic_ISBN
    978-1-4244-1573-1
  • Type

    conf

  • DOI
    10.1109/INEC.2008.4585538
  • Filename
    4585538