• DocumentCode
    2367277
  • Title

    Effects of nonmodel errors on model-based testing

  • Author

    Stenbakken, Gerard N.

  • fYear
    1995
  • fDate
    24-26 April 1995
  • Firstpage
    38
  • Abstract
    In previous work, methods have been developed for efficient testing of components and instruments that are based on models of these units. These methods allow for the full behavior of these units to be predicted from a small but efficient set of test measurements. Such methods can significantly reduce the testing cost of such units by reducing the amount of testing required. But these methods are valid only as long as the model accurately represents the behavior of the units. Previous papers on this subject described many methods for developing accurate models and using them to develop efficient test methods. However, they gave little consideration to the problem of testing units which change their behavior after the model has been developed, for example, as a result of changes in the manufacturing process. Such changed behavior is referred to as nonmodel behavior or nonmodel error. When units with this new behavior are tested with these more efficient methods, their predicted behavior can show significant deviations from their true behavior. This paper describes how to analyze the data taken at the reduced set of measurements to estimate the uncertainty in the model predictions, even when the device has significant nonmodel error. Results of simulation are used to verify the accuracy of the estimates and to show the expected variation in the results for many modeling variables
  • Keywords
    Costs; Data analysis; Electronic equipment testing; Instruments; Manufacturing processes; NIST; Optimization methods; Predictive models; Production; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1995. IMTC/95. Proceedings. Integrating Intelligent Instrumentation and Control., IEEE
  • Conference_Location
    Waltham, MA, USA
  • Print_ISBN
    0-7803-2615-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1995.515099
  • Filename
    515099