Title :
An automatic circuit extractor for RTL verification
Author :
Li, Tun ; Guo, Yang ; Li, Sikun
Author_Institution :
Nat. Univ. of Defense Technol., Hunan, China
Abstract :
For RTL verification, we have to separate the control and datapath parts contained in the whole design, and apply different verification techniques for different parts. This paper presents a new circuit extraction method using program slicing technique, and develops an elegant theoretical basis based on program slicing for circuit extraction from Verilog description. The technique can obtain a chaining slice for given signals of interest. Compared with related researches, the main advantages of our method include: it is fine grain; it has no HDL coding style limitation; it is precise and is capable of dealing with various Verilog constructions. The technique has been integrated with a commercial simulation environment and incorporated into a design process. The experimental results on practical designs show the significant benefits of the proposed approach.
Keywords :
automatic test pattern generation; circuit simulation; hardware description languages; logic CAD; logic simulation; program slicing; RTL verification; Verilog description; automatic circuit extractor; interprocess communication; process dependence graph; program slicing technique; simulation environment; static program analysis technique; Algorithm design and analysis; Application software; Automatic control; Circuit simulation; Circuit synthesis; Data mining; Design automation; Hardware design languages; Process design; Signal design; Signal processing;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250801