Title :
Investigation on Performance and Vacuum Package of MEMS Infrared Focal Plane Arrays
Author :
Yi Ou ; Zhigang Li ; Furong Qu ; Kai Yang ; Yu Liu ; Dapeng Chen ; Tianchun Ye
Author_Institution :
Key Lab. of Microelectron. Devices & Integrated Technol., Inst. of Microelectron., Beijing, China
Abstract :
A substrate-free microelectromechanical system (MEMS) focal plane array (FPA) has been successfully developed. Since there is no silicon substrate beneath the FPA´s pixels, the infrared radiation (IR) loss has been significantly reduced. However, at ambient pressure, it is difficult to obtain a clear visible image due to the sensitivity loss caused by the thermal conductance of air. To improve the packaged FPA´s performance, its thermal sensitivity and response time were investigated under varying air pressure. The high-contrast IR thermal images of a human hand were captured at room temperature and under an air pressure of 0.01 Pa, and the noise-equivalent temperature difference of the FPA was also estimated to be about 373 mK compared with the 1.4 K under a pressure of 10 Pa. What is important is that the FPA´s response time was increased from 50.1 to 336.6 ms by the decrease in air pressure. In addition, we present an approach to package the MEMS FPA at a low-pressure vacuum with two optical windows, which is an effective way to increase FPA´s sensitivity.
Keywords :
electronics packaging; focal planes; infrared imaging; micromechanical devices; thermal conductivity; vacuum techniques; FPA pixels; FPA sensitivity; IR loss; MEMS FPA; MEMS infrared focal plane arrays; air pressure; focal plane array; high-contrast IR thermal images; human hand; infrared radiation loss; low-pressure vacuum; noise-equivalent temperature; optical windows; packaged FPA performance; pressure 0.01 Pa; response time; temperature 293 K to 298 K; thermal conductance; thermal sensitivity; time 50.1 ms to 336.6 ms; vacuum package; visible image; Micromechanical devices; Optical device fabrication; Optical imaging; Packaging; Performance evaluation; Sensitivity; Time factors; Focal plane array (FPA); microelectromechanical systems (MEMSs); response time; thermal sensitivity; uncooled; vacuum package;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2012.2237500