DocumentCode
2367718
Title
Power conscious BIST design for sequential circuits using ghost-FSM
Author
Roy, S. ; Sikdar, Biplab K.
Author_Institution
Dept. of Comput. Sci. & Eng., Kalyani Govt. Eng. Coll., India
fYear
2003
fDate
16-19 Nov. 2003
Firstpage
190
Lastpage
195
Abstract
This paper presents an efficient BIST scheme with low power consumption for sequential circuits. The BIST structure is obtained by using a ghost-FSM. A multiobjective genetic algorithm (MOGA) is employed to optimize the twin criteria of BIST quality and power consumption of the resultant circuit simultaneously. The scheme ensures enhancement of fault coverage along with minimization of power overhead of the BISTed circuits. Experimental results on MCNC benchmarks confirm the effectiveness of the proposed scheme to produce circuits with improved fault efficiency along with lower power consumption.
Keywords
Pareto optimisation; built-in self test; finite state machines; genetic algorithms; logic CAD; logic testing; power consumption; sequential circuits; state assignment; BIST quality; MCNC benchmarks; Pareto-optimal solutions; efficient BIST scheme; fault coverage; ghost-FSM; improved fault efficiency; low power consumption; multiobjective genetic algorithm; power overhead minimization; sequential circuits; Built-in self-test; Circuit faults; Computer science; Design automation; Educational institutions; Energy consumption; Finite state machines; Flip-flops; Genetic algorithms; Logic circuit testing; Power demand; Power engineering and energy; Self-testing; Sequential circuits; Sequential logic circuits; State assignment; Strontium;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1951-2
Type
conf
DOI
10.1109/ATS.2003.1250808
Filename
1250808
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