• DocumentCode
    2367718
  • Title

    Power conscious BIST design for sequential circuits using ghost-FSM

  • Author

    Roy, S. ; Sikdar, Biplab K.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Kalyani Govt. Eng. Coll., India
  • fYear
    2003
  • fDate
    16-19 Nov. 2003
  • Firstpage
    190
  • Lastpage
    195
  • Abstract
    This paper presents an efficient BIST scheme with low power consumption for sequential circuits. The BIST structure is obtained by using a ghost-FSM. A multiobjective genetic algorithm (MOGA) is employed to optimize the twin criteria of BIST quality and power consumption of the resultant circuit simultaneously. The scheme ensures enhancement of fault coverage along with minimization of power overhead of the BISTed circuits. Experimental results on MCNC benchmarks confirm the effectiveness of the proposed scheme to produce circuits with improved fault efficiency along with lower power consumption.
  • Keywords
    Pareto optimisation; built-in self test; finite state machines; genetic algorithms; logic CAD; logic testing; power consumption; sequential circuits; state assignment; BIST quality; MCNC benchmarks; Pareto-optimal solutions; efficient BIST scheme; fault coverage; ghost-FSM; improved fault efficiency; low power consumption; multiobjective genetic algorithm; power overhead minimization; sequential circuits; Built-in self-test; Circuit faults; Computer science; Design automation; Educational institutions; Energy consumption; Finite state machines; Flip-flops; Genetic algorithms; Logic circuit testing; Power demand; Power engineering and energy; Self-testing; Sequential circuits; Sequential logic circuits; State assignment; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2003. ATS 2003. 12th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1951-2
  • Type

    conf

  • DOI
    10.1109/ATS.2003.1250808
  • Filename
    1250808