DocumentCode :
2367718
Title :
Power conscious BIST design for sequential circuits using ghost-FSM
Author :
Roy, S. ; Sikdar, Biplab K.
Author_Institution :
Dept. of Comput. Sci. & Eng., Kalyani Govt. Eng. Coll., India
fYear :
2003
fDate :
16-19 Nov. 2003
Firstpage :
190
Lastpage :
195
Abstract :
This paper presents an efficient BIST scheme with low power consumption for sequential circuits. The BIST structure is obtained by using a ghost-FSM. A multiobjective genetic algorithm (MOGA) is employed to optimize the twin criteria of BIST quality and power consumption of the resultant circuit simultaneously. The scheme ensures enhancement of fault coverage along with minimization of power overhead of the BISTed circuits. Experimental results on MCNC benchmarks confirm the effectiveness of the proposed scheme to produce circuits with improved fault efficiency along with lower power consumption.
Keywords :
Pareto optimisation; built-in self test; finite state machines; genetic algorithms; logic CAD; logic testing; power consumption; sequential circuits; state assignment; BIST quality; MCNC benchmarks; Pareto-optimal solutions; efficient BIST scheme; fault coverage; ghost-FSM; improved fault efficiency; low power consumption; multiobjective genetic algorithm; power overhead minimization; sequential circuits; Built-in self-test; Circuit faults; Computer science; Design automation; Educational institutions; Energy consumption; Finite state machines; Flip-flops; Genetic algorithms; Logic circuit testing; Power demand; Power engineering and energy; Self-testing; Sequential circuits; Sequential logic circuits; State assignment; Strontium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-1951-2
Type :
conf
DOI :
10.1109/ATS.2003.1250808
Filename :
1250808
Link To Document :
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