DocumentCode
2367804
Title
Build-in-self-test for software
Author
Xu, Shiyi
Author_Institution
Shanghai Univ., China
fYear
2003
fDate
16-19 Nov. 2003
Firstpage
220
Lastpage
223
Abstract
Software testing has been a hard nut in the testing area for its complex and time-consuming nature. Taking advantage of mature technologies in hardware testing, we proposed a new approach to developing a new dimension of software testing called build-in-self-test (BIST) for software, which has long been applied in hardware testing as well as design for testability. This idea of testing methods from hardware is just to alleviate the burden of testing for software by transferring some testing work onto the programmer during programming so that the programmer and the tester can work together. Some new ideas are presented for further work.
Keywords
built-in self test; design for testability; program testing; DFT; build-in-self-test; design for testability; programmer test generation; software BIST; software testing; Design for testability; Self-testing; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1951-2
Type
conf
DOI
10.1109/ATS.2003.1250813
Filename
1250813
Link To Document