• DocumentCode
    2367804
  • Title

    Build-in-self-test for software

  • Author

    Xu, Shiyi

  • Author_Institution
    Shanghai Univ., China
  • fYear
    2003
  • fDate
    16-19 Nov. 2003
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    Software testing has been a hard nut in the testing area for its complex and time-consuming nature. Taking advantage of mature technologies in hardware testing, we proposed a new approach to developing a new dimension of software testing called build-in-self-test (BIST) for software, which has long been applied in hardware testing as well as design for testability. This idea of testing methods from hardware is just to alleviate the burden of testing for software by transferring some testing work onto the programmer during programming so that the programmer and the tester can work together. Some new ideas are presented for further work.
  • Keywords
    built-in self test; design for testability; program testing; DFT; build-in-self-test; design for testability; programmer test generation; software BIST; software testing; Design for testability; Self-testing; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2003. ATS 2003. 12th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1951-2
  • Type

    conf

  • DOI
    10.1109/ATS.2003.1250813
  • Filename
    1250813