Title :
CDM tests on interface test chips for the verification of ESD protection concepts
Author :
Brodbeck, Tilo ; Esmark, Kai ; Stadler, Wolfgang
Author_Institution :
Infineon Technol. AG, Munich
Abstract :
The CDM failure threshold of microelectronic components are determined by the peak value of the discharge current. The requirements of the market, however, are given in terms of potential. In addition, it is not known how the CDM susceptibility of an IC is affected by its core circuitry. This paper introduces an idea how CDM protection concepts can be checked by tests on an interface test chip to guarantee satisfying product qualifications.
Keywords :
electrostatic discharge; integrated circuit testing; CDM failure threshold; CDM tests; ESD protection concepts; charged device mode; core circuitry; discharge current; interface test chips; microelectronic components; CMOS technology; Capacitance; Circuit testing; Electrostatic discharge; Integrated circuit testing; Microelectronics; Packaging; Protection; Qualifications; Threshold voltage;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401725
