• DocumentCode
    2367848
  • Title

    No-reference objective wavelet based noise immune image sharpness metric

  • Author

    Ferzli, R. ; Karam, Lina J.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    This paper focuses on no-reference image sharpness/blurriness metrics due to their importance in image, video, and biomedical applications. Simulation results show that existing no-reference objective image sharpness metrics fail to predict correctly the sharpness of images in the presence of noise. A noise-immune wavelet-based sharpness metric is proposed based on the Lipschitz regularity for differentiating between edges and noise singularities. Comparison results reveal the superiority of the proposed method when dealing with a moderate noisy environment.
  • Keywords
    image denoising; image restoration; wavelet transforms; Lipschitz regularity; biomedical applications; blurriness metrics; no-reference objective wavelet; noise singularities; noise-immune wavelet-based sharpness metric; Autocorrelation; Frequency; Image edge detection; Immune system; Laplace equations; Measurement techniques; Predictive models; Scanning electron microscopy; Video compression; Working environment noise; blurriness; no-reference quality metric; noise immune sharpness metric; sharpness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2005. ICIP 2005. IEEE International Conference on
  • Print_ISBN
    0-7803-9134-9
  • Type

    conf

  • DOI
    10.1109/ICIP.2005.1529773
  • Filename
    1529773