DocumentCode :
2367848
Title :
No-reference objective wavelet based noise immune image sharpness metric
Author :
Ferzli, R. ; Karam, Lina J.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Volume :
1
fYear :
2005
fDate :
11-14 Sept. 2005
Abstract :
This paper focuses on no-reference image sharpness/blurriness metrics due to their importance in image, video, and biomedical applications. Simulation results show that existing no-reference objective image sharpness metrics fail to predict correctly the sharpness of images in the presence of noise. A noise-immune wavelet-based sharpness metric is proposed based on the Lipschitz regularity for differentiating between edges and noise singularities. Comparison results reveal the superiority of the proposed method when dealing with a moderate noisy environment.
Keywords :
image denoising; image restoration; wavelet transforms; Lipschitz regularity; biomedical applications; blurriness metrics; no-reference objective wavelet; noise singularities; noise-immune wavelet-based sharpness metric; Autocorrelation; Frequency; Image edge detection; Immune system; Laplace equations; Measurement techniques; Predictive models; Scanning electron microscopy; Video compression; Working environment noise; blurriness; no-reference quality metric; noise immune sharpness metric; sharpness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN :
0-7803-9134-9
Type :
conf
DOI :
10.1109/ICIP.2005.1529773
Filename :
1529773
Link To Document :
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