DocumentCode
2367870
Title
Fault diagnosis for physical defects of unknown behaviors
Author
Wen, Xiaoqing ; Tamamoto, Hideo ; Saluja, Kewal K. ; Kinoshita, Kozo
Author_Institution
SynTest Technol., Inc., Sunnyvale, CA, USA
fYear
2003
fDate
16-19 Nov. 2003
Firstpage
236
Lastpage
241
Abstract
This paper proposes an X-fault model for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Based on these, an X-fault diagnosis method is described to improve the failure analysis for a wide range of physical defects in complex IC circuits.
Keywords
diagnostic reasoning; fault simulation; integrated circuit testing; logic simulation; logic testing; symbol manipulation; X symbols; X-fault model; complex IC circuits; diagnostic reasoning method; efficient X-fault simulation method; failure analysis; fault diagnosis; gate-level circuit; logic combination; physical defects; symbolic simulation; two-valued simulation; unknown behaviors; Circuit faults; Circuit simulation; Delay effects; Diagnostic reasoning; Failure analysis; Fault diagnosis; Informatics; Integrated circuit testing; Logic circuit testing; Logic circuits; Performance analysis; Silicon; Symbol manipulation; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2003. ATS 2003. 12th Asian
ISSN
1081-7735
Print_ISBN
0-7695-1951-2
Type
conf
DOI
10.1109/ATS.2003.1250816
Filename
1250816
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