• DocumentCode
    2367878
  • Title

    The first-principles calculation of the effects oxygen defect on the electronic structure of SnO2

  • Author

    Jun-Feng, Yan ; Zhi-yong, Zhang ; Fu-Chun, Zhang ; Jiang-Ni, Yun ; Wu, Zhao ; Zhou-Hu, Deng

  • Author_Institution
    Sch. of Inf. Sci. & Technol., Northwest Univ., Xi´´an
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    645
  • Lastpage
    650
  • Abstract
    In order to investigate the effects oxygen defect on the electronic structure of SnO2, the structural change, band structure, density of states, and electron density difference of (11macr0) surface of SnO2 in the rutile lattice phase were performed by the first-principles calculation of plane wave ultra-soft pseudo-potential technology based on the density function theory. The calculated conclusions were revealed that the oxygen defect changed the inner energy of SnO2 crystal; the SnO2 with oxygen vacancy defects had high conductivity of semiconductor; while the defect of surplus oxygen atom in interstitial position cause to enhance the degeneracy of VBs and weaken the communizing motion of electrons. The research results strongly guide the technical process of preparing SnO2 thin film and powder in theory, and have scientific and theoretical value.
  • Keywords
    ab initio calculations; crystal structure; density functional theory; electrical conductivity; electronic density of states; interstitials; pseudopotential methods; semiconductor thin films; surface states; tin compounds; vacancies (crystal); valence bands; wide band gap semiconductors; (110) surface; SnO2; band structure; crystal inner energy; crystal structure; density function theory; density of states; electrical conductivity; electron density; electronic structure; first-principles calculation; interstitial; oxygen defect; plane wave ultrasoft pseudopotential technology; rutile lattice phase; transparent conducting film material; vacancy; valence band degeneracy; wide band-gap material; Nanoelectronics; First-principles; electronic structure; transparent conducting films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1572-4
  • Electronic_ISBN
    978-1-4244-1573-1
  • Type

    conf

  • DOI
    10.1109/INEC.2008.4585569
  • Filename
    4585569