Title :
Obtaining TLP-like information from an HBM simulator
Author :
Grund, Evan ; Hernandez, Marcos
Author_Institution :
Thermo Fisher Sci., Fremont
Abstract :
Obtaining TLP-type data from properly instrumented HBM systems is demonstrated. Parameters similar to those extracted by TLP are measured from HBM pulses. The new concept of "DUT snapback impedance" is introduced to explain DUT response to 1500Omega HBM pulses and various impedance TLP systems. Observed stresses with HBM, not present in TLP, may account for some HBM-TLP miscorrelations.
Keywords :
electric impedance measurement; electron device testing; noise measurement; DUT snapback impedance; HBM simulator; device under test; human body model; impedance TLP systems; transmission line pulser; Current measurement; Data mining; Impedance measurement; Instruments; Oscilloscopes; Pulse measurements; Steady-state; Stress; Testing; Voltage;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401737
