DocumentCode
2368015
Title
Obtaining TLP-like information from an HBM simulator
Author
Grund, Evan ; Hernandez, Marcos
Author_Institution
Thermo Fisher Sci., Fremont
fYear
2007
fDate
16-21 Sept. 2007
Abstract
Obtaining TLP-type data from properly instrumented HBM systems is demonstrated. Parameters similar to those extracted by TLP are measured from HBM pulses. The new concept of "DUT snapback impedance" is introduced to explain DUT response to 1500Omega HBM pulses and various impedance TLP systems. Observed stresses with HBM, not present in TLP, may account for some HBM-TLP miscorrelations.
Keywords
electric impedance measurement; electron device testing; noise measurement; DUT snapback impedance; HBM simulator; device under test; human body model; impedance TLP systems; transmission line pulser; Current measurement; Data mining; Impedance measurement; Instruments; Oscilloscopes; Pulse measurements; Steady-state; Stress; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-136-5
Type
conf
DOI
10.1109/EOSESD.2007.4401737
Filename
4401737
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