Title :
Behavioural Performance and Variation Modelling for Hierarchical-based Analogue IC Design
Author :
Ali, Sawal ; Wilcock, Reuben ; Wilson, Peter
Author_Institution :
Electron. Syst. Design Group, Univ. of Southampton, Southampton
Abstract :
A new approach in hierarchical optimisation is presented which is capable of optimising both the performance and yield of an analogue design. Performance and yield trade offs are analysed using a combination of multi-objective evolutionary algorithms and Monte Carlo simulations. A behavioural model that combines the performance and variation for a given circuit topology is developed which can be used to optimise the system level structure. The approach enables top-down system optimisation, not only for performance but also for yield. The model has been developed in Verilog-A and tested extensively with practical designs using the Spectre simulator. A benchmark OTA circuit is used to demonstrate the behavioural model development and a 7th order video filter has been designed to demonstrate hierarchical optimisation at the system level. The results have been verified with transistor level simulations and suggest that an accurate performance and yield prediction can be achieved with the proposed algorithm.
Keywords :
Monte Carlo methods; analogue integrated circuits; evolutionary computation; filters; hierarchical systems; network topology; operational amplifiers; optimisation; 7th order video filter; Monte Carlo simulations; OTA circuit; Spectre simulator; Verilog-A; analogue design; circuit topology; hierarchical optimisation; hierarchical-based analogue IC design; multiobjective evolutionary algorithms; top-down system optimisation; transistor level simulations; Algorithm design and analysis; Analog integrated circuits; Circuit simulation; Circuit testing; Circuit topology; Design optimization; Evolutionary computation; Hardware design languages; Integrated circuit modeling; Performance analysis;
Conference_Titel :
Behavioral Modeling and Simulation Workshop, 2008. BMAS 2008. IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2896-0
DOI :
10.1109/BMAS.2008.4751253