Title :
Test synthesis for datapaths using datapath-controller functions
Author :
Inoue, Michiko ; Suzuki, Kazuhiro ; Okamoto, Hiroyuki ; Fujiwara, Hideo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
Abstract :
This paper proposes a test syntheses method for datapaths. The proposed method goes on design-for-testability while generating control sequences for justification and propagation at register-transfer level. Since the method fully utilizes functions of controllers as well as datapaths, it achieves small area overhead.
Keywords :
automatic test pattern generation; design for testability; logic CAD; logic testing; tree searching; at-speed testing; branch-and-bound algorithm; control sequences; datapath-controller functions; datapaths test synthesis; design-for-testability; hierarchical test generation; integration approach; register-transfer level; small area overhead; Circuit faults; Circuit testing; Controllability; Costs; Design automation; Design for testability; Design methodology; Hardware; High level synthesis; Information science; Logic circuit testing; Pattern analysis; Tree searching;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250826
