Title :
Modeling of multiple vias with a shared anti-pad in an irregular plate pair using domain decomposition approach
Author :
Yao-Jiang Zhang ; Xiaoxiong Gu ; Liehui Ren ; Dazhao Liu ; Jun Fan
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
An irregular plate pair with multiple vias sharing an anti-pad is decomposed into top/bottom plate-thickness domain and parallel-plate domain whose admittance matrices are calculated by three-dimensional (3D) finite element method (FEM) and hybrid 3D/2D FEM. Combined admittance matrix algorithm is used to obtain the final admittance matrix of the plate pair including finite thickness plates. The widely-used assumption of transverse electromagnetic (TEM) modes on anti-pads is carefully investigated by comparing the combined admittance matrix algorithm with hybrid 3D/2D FEM. It is found that higher-order modes are excited on anti-pads and in practical printed circuit board, the higher-order modes can penetrate from one layer of plate pair to another layer. This may provide guidance for future research for multiple vias in a shared anti-pad.
Keywords :
TEM cells; electric admittance; finite element analysis; matrix decomposition; vias; 3D finite element method; TEM modes; admittance matrices; anti-pad; combined admittance matrix algorithm; domain decomposition approach; final admittance matrix; finite thickness plates; higher-order modes; hybrid 3D-2D FEM; irregular plate pair; multiple vias; parallel-plate domain; printed circuit board; three-dimensional FEM; top-bottom plate-thickness domain; transverse electromagnetic modes; Admittance; Computer aided manufacturing; Finite element analysis; Insertion loss; Matrix decomposition; Three-dimensional displays; Transmission line matrix methods;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location :
Raleigh, NC
Print_ISBN :
978-1-4799-5544-2
DOI :
10.1109/ISEMC.2014.6898982