Lowering cost of test: parallel test or low-cost ATE?

Author

Rivoir, Jochen

Author_Institution

Agilent Technol., Boeblingen, Germany

fYear

2003

fDate

16-19 Nov. 2003

Firstpage

360

Lastpage

363

Abstract

Low cost ATE has often been promoted as the obvious solution to reduce the cost of test. Parallel test is another well-known approach, where multiple devices are tested on one tester (multi-site test) while multiple blocks within one device are tested concurrently. This paper shows quantitatively that parallel test reduces test cost more effectively than low-cost ATE, because it reduces all test cost contributors, not only the capital cost of ATE.

Keywords

automatic test equipment; integrated circuit economics; integrated circuit testing; ATE capital cost; concurrent multiple block testing; low-cost ATE; multisite test; parallel test; test cost contributors; test cost reduction; Automatic test equipment; Automatic testing; Costs; Design for testability; Integrated circuit testing; Manufacturing processes; Production; Semiconductor device manufacture; Semiconductor process modeling; Sequential analysis; System testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2003. ATS 2003. 12th Asian

ISSN

1081-7735

Print_ISBN

0-7695-1951-2

Type

conf

DOI

10.1109/ATS.2003.1250837

Filename

1250837

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2368307