Title :
March SL: a test for all static linked memory faults
Author :
Hamdioui, Said ; Al-Ars, Zaid ; Van de Goor, Ad J. ; Rodgers, Mike
Abstract :
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all possible linked faults. The tests are merged into a single test, March SL, detecting all faults in the linked fault space. The preliminary test results of an experiment done at Intel are reported; they show that March SL scores high and detects some unique faults.
Keywords :
logic testing; random-access storage; March SL memory test; RAM; fault coverage; functional fault models; linked fault space; static linked memory fault testing; unique faults; Circuit faults; Circuit testing; Costs; Fault detection; Information technology; Laboratories; Logic circuit testing; Random access memories; Semiconductor device testing; System testing; Systems engineering and theory; Very large scale integration;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250839
