• DocumentCode
    2368367
  • Title

    Quick check of ESD bags for shielding efficiency

  • Author

    Sancho, José D.

  • Author_Institution
    NASA, Greenbelt
  • fYear
    2007
  • fDate
    16-21 Sept. 2007
  • Abstract
    This paper proposes an economical ESD bag test which would prevent defective ESD bags from being used to store electrostatic discharge sensitive (ESDS) hardware. This method measures voltage rather than energy attenuation to classify the bags in a go/no-go test. There is a chance that some marginally good bags will be rejected but the cost of discarding those bags would be offset by the cost using the ESDA compliant equipment.
  • Keywords
    electromagnetic shielding; electrostatic discharge; ESDS hardware; economical ESD bag test; electrostatic discharge sensitive hardware; shielding efficiency; voltage measurement; Assembly; Attenuation; Costs; Electrostatic discharge; Hardware; Materials testing; NASA; Probes; Protection; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-58537-136-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2007.4401756
  • Filename
    4401756
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2368367