Title :
Quick check of ESD bags for shielding efficiency
Author_Institution :
NASA, Greenbelt
Abstract :
This paper proposes an economical ESD bag test which would prevent defective ESD bags from being used to store electrostatic discharge sensitive (ESDS) hardware. This method measures voltage rather than energy attenuation to classify the bags in a go/no-go test. There is a chance that some marginally good bags will be rejected but the cost of discarding those bags would be offset by the cost using the ESDA compliant equipment.
Keywords :
electromagnetic shielding; electrostatic discharge; ESDS hardware; economical ESD bag test; electrostatic discharge sensitive hardware; shielding efficiency; voltage measurement; Assembly; Attenuation; Costs; Electrostatic discharge; Hardware; Materials testing; NASA; Probes; Protection; Voltage;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401756