DocumentCode :
2368367
Title :
Quick check of ESD bags for shielding efficiency
Author :
Sancho, José D.
Author_Institution :
NASA, Greenbelt
fYear :
2007
fDate :
16-21 Sept. 2007
Abstract :
This paper proposes an economical ESD bag test which would prevent defective ESD bags from being used to store electrostatic discharge sensitive (ESDS) hardware. This method measures voltage rather than energy attenuation to classify the bags in a go/no-go test. There is a chance that some marginally good bags will be rejected but the cost of discarding those bags would be offset by the cost using the ESDA compliant equipment.
Keywords :
electromagnetic shielding; electrostatic discharge; ESDS hardware; economical ESD bag test; electrostatic discharge sensitive hardware; shielding efficiency; voltage measurement; Assembly; Attenuation; Costs; Electrostatic discharge; Hardware; Materials testing; NASA; Probes; Protection; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
Type :
conf
DOI :
10.1109/EOSESD.2007.4401756
Filename :
4401756
Link To Document :
بازگشت