DocumentCode :
2368458
Title :
Resonant-body Fin-FETs with sub-nW power consumption
Author :
Bartsch, Sebastian T. ; Grogg, Daniel ; Lovera, Andrea ; Tsamados, Dimitrios ; Ayöz, Suat ; Ionescu, Adrian M.
Author_Institution :
Nanoelectronic Devices Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear :
2010
fDate :
6-8 Dec. 2010
Abstract :
This paper presents, for the first time, experimental evidence on resonant-body Fin-FETs (RB-FinFET) with two independent lateral gates, operated from weak to strong inversion, which enables unique trade-off between power consumption and gain. Resonance frequencies from 25 MHz to 80 MHz with quality factors of the order of 3000 and motional resistances of the order of tens of kOhm are demonstrated with a mixer mode measurement technique, dedicated to ultra-scaled resonators. The power consumption of the active resonators can be reduced in weak inversion of the RB-FinFET well below 1nW, which is a record value compared to any prior active NEM resonator.
Keywords :
MOSFET; Q-factor; semiconductor device manufacture; active resonators; frequency 25 MHz to 80 MHz; independent lateral gates; mixer mode measurement technique; quality factors; resonant-body Fin-FET; ultra-scaled resonators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2010 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4424-7418-5
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2010.5703318
Filename :
5703318
Link To Document :
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