DocumentCode :
2368488
Title :
Integrated Over Voltage Protection Circuits for Power Transistors
Author :
Alkayal, F. ; Crebier, J.-C. ; Schaeffer, C.
Author_Institution :
LEG-ENSIEG, Domaine Univ., St. Martin d´´Heres
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
1
Lastpage :
4
Abstract :
Nowadays, MOSFET and IGBT power components are widely used in medium and high power converters. They are subjected to increasing requirements: electrical performances, simple implementation, reliability, integration, smaller volume and price. Moreover, their integration process offers the possibility to reduce or eliminate the need for pick and place, bonding (wafer- and/or ball-bonding) and other assembly processes necessary in hybrid assemblies, and in the same time to add some useful functionality like sensors for protection and control. This paper presents an overview of integrated solutions for active over voltage protection circuits. A short state of the art presents the main integrated topologies and compares them. Technological, electrical and thermal compatibilities and interactions are investigated in order to outline what are the benefits but also the limitations of over voltage protection circuit integration. In particular, this analysis tries to evaluate the thermal impact of the protection circuit, which is a dissipative element, on the integrated die and the power switch. Monolithic and hybrid interconnects are also considered in the paper to outline possible benefits from the integration. Several results from simulations but also practice are available in the paper to validate comments and conclusions
Keywords :
overvoltage protection; power MOSFET; power bipolar transistors; wafer bonding; IGBT power components; MOSFET power components; assembly process; ball-bonding; integrated over voltage protection circuits; power converters; power switch; power transistors; thermal impact; wafer-bonding; Assembly; Circuit topology; Insulated gate bipolar transistors; Integrated circuit reliability; MOSFET circuits; Power MOSFET; Power transistors; Protection; Voltage control; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on
Conference_Location :
Naples
Print_ISBN :
0-7803-9714-2
Type :
conf
DOI :
10.1109/ISPSD.2006.1666116
Filename :
1666116
Link To Document :
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