DocumentCode
2368494
Title
Effect of large device capacitance on FICDM peak current
Author
Atwood, B.C. ; Yuanzhong Zhou ; Clarke, D. ; Weyl, T.
Author_Institution
Analog Devices, Inc., Wilmington
fYear
2007
fDate
16-21 Sept. 2007
Abstract
This paper gives solutions to the differential equations of the FICDM tester. Data and theory show that the peak current for FICDM tests increases as the DUT capacitance increases, but approaches a maximum that is a function of the tester field plate capacitance and becomes rather independent of the DUT capacitance.
Keywords
capacitance measurement; capacitors; differential equations; electron device testing; DUT capacitance; FICDM peak current; FICDM test; device under test; differential equation; field induced charged device model; large device capacitance; tester field plate capacitance; Capacitance; Capacitors; Circuit testing; Data mining; Differential equations; Electronics packaging; Equivalent circuits; Inductance; Oscilloscopes; Sparks;
fLanguage
English
Publisher
ieee
Conference_Titel
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-136-5
Type
conf
DOI
10.1109/EOSESD.2007.4401763
Filename
4401763
Link To Document