Title :
A single electron device and circuit simulator with a new algorithm to incorporate co-tunneling
Author :
Wasshuber, C. ; Kosina, H.
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Austria
Abstract :
Introduces a single electron device and circuit simulator for the investigation of devices and circuits consisting of tunnel junctions, capacitors, constant voltage sources, piecewise linear voltage sources and voltage controlled voltage sources. The simulator features a new algorithm to incorporate the quantum mechanical effect of co-tunneling. The basic simulation method is to calculate tunnel rates for all possible tunnel events starting from a particular state (charge distribution) of the circuit. These tunnel rates strongly depend on the change in free energy, of the whole circuit. Every system tends to a state of lower energy and therefore tunnel events that lower the free energy are more likely to happen.
Keywords :
Monte Carlo methods; piecewise-linear techniques; semiconductor device models; single electron transistors; tunnelling; charge distribution; circuit simulator; co-tunneling; constant voltage sources; free energy; piecewise linear voltage sources; quantum mechanical effect; single electron device; tunnel rates; voltage controlled voltage sources; Capacitors; Circuit simulation; Difference equations; Discrete event simulation; Microelectronics; Monte Carlo methods; Random variables; Single electron devices; State-space methods; Voltage control;
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 1996. SISPAD 96. 1996 International Conference on
Print_ISBN :
0-7803-2745-4
DOI :
10.1109/SISPAD.1996.865311