DocumentCode
236859
Title
Switching voltage regulator noise coupling to connector signal pins through near field radiation
Author
Gong Ouyang ; Kai Xiao ; Wei Xu ; Jiangqi He ; Jin Fang ; Geng Tian ; Xiaoning Ye ; Yinglei Ren ; Yuan-Liang Li ; Pengchong Li
Author_Institution
Data Center Group, Intel Corp., Dupont, WA, USA
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
362
Lastpage
369
Abstract
In a server system, the switching voltage regulator (VR) noise coupled to the IO pins of the adjacent memory riser connector through the open air above the base board, and the link performance was impacted by the coupling. A simulation flow was developed to reproduce this EMI phenomenon. The flow first used electromagnetic field solvers to extract the VR related power network and the VR-IO coupling network, and then the di/dt and dv/dt noise sources and the induced IO noise were solved in HSpice®. The simulation revealed the underlying coupling mechanism: The high frequency current loop formed by the power MOSFET, the VR power shapes, the snubber RC circuit at the bottom layer of the board, and the stitching via acted as a transmitting loop antenna, and the radiating field propagated through the air and was picked up by another loop (receiving antenna) formed by the riser connector pins. An effective mitigation method is to use bigger snubber resistor to damp this near field radiation. Both the coupling theory and the effectiveness of the mitigation method were proved by the measurements.
Keywords
electric connectors; electromagnetic interference; electromagnetic wave propagation; power MOSFET; receiving antennas; snubbers; transmitting antennas; voltage regulators; VR power shapes; adjacent memory riser connector; connector signal pins; electromagnetic field solvers; high frequency current loop; near field radiation; noise sources; power MOSFET; snubber RC circuit; switching voltage regulator noise coupling; transmitting loop antenna; Couplings; MOSFET; Noise; Resistors; Snubbers; Switches; EMI; connector; electromagnetics coupling; loop antenna; near field radiation; near field scanning; noise; simulation; snubber; switching voltage regulator;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6898998
Filename
6898998
Link To Document