Title :
Shielded cable discharge induces current on interior signal lines
Author :
Poon, Steven S. ; Maloney, Timothy J.
Author_Institution :
Intel Corp., Santa Clara
Abstract :
Cable discharge event (CDE) stress to interior lines for shielded cables is measured and simulated. A W-shaped induced current pulse can appear on the interior lines due to discharge of the shield. Time domain analysis of the W-pulse and related conditions are discussed.
Keywords :
cable shielding; discharges (electric); time-domain analysis; W-shaped induced current pulse; interior signal lines; shielded cable discharge induces current; time domain analysis; Cable shielding; Conductors; Connectors; Couplings; Impedance; Pins; Power cables; Stress; Universal Serial Bus; Voltage;
Conference_Titel :
29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-136-5
DOI :
10.1109/EOSESD.2007.4401768
