Title :
Design retargetable platform system for microprocessor functional test
Author :
Ling, Liu ; Wennan, Feng ; Song, Jia ; Anping, Jiang ; Lijiu, Ji
Author_Institution :
IME, Peking Univ., Beijing, China
Abstract :
Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator, retargetable assembler and strong ATPG the platform system could automatically produce different test environment and assemble out relative test codes to adapt to the microprocessor under test. Experiments show that the platform system works correctly, flexibly and efficiently.
Keywords :
automatic test pattern generation; circuit complexity; design for testability; integrated circuit testing; microprocessor chips; ATPG; assembler; code mapping description language; configurable test environment generator; dataflow; design retargetable platform system; instruction-level retargetability; microprocessor functional test; relative test codes; Assembly systems; Automatic test pattern generation; Automatic testing; Character generation; Circuit testing; Design for testability; Digital systems; Integrated circuit testing; Microprocessors; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
Test Symposium, 2003. ATS 2003. 12th Asian
Print_ISBN :
0-7695-1951-2
DOI :
10.1109/ATS.2003.1250856
