Title :
Successful Development of 1.2 kV 4H-SiC MOSFETs with the Very Low On-Resistance of 5 m Ω cm2
Author :
Miura, N. ; Fujihira, K. ; Nakao, Y. ; Watanabe, Toshio ; Tarui, Y. ; Kinouchi, S. ; Imaizumi, Masayuki ; Oomori, T.
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo
Abstract :
4H-SiC MOSFETs comprised of a miniaturized unit cell structure were fabricated. The epilayer channel configuration was employed to effectively improve the MOSFET electrical characteristics. A specific on-resistance of 5 mOmegacm2 with a stable avalanche breakdown of 1.35 kV was successfully recorded. Temperature dependence of the Ron,sp examined and the Ron,sp exhibited still low value of 8.5 mOmegacm2 at 150 degC . The SiC-MOSFETs were put together with SiC-SBDs to realize prototype SiC power modules. A switching energy loss was significantly reduced by employing the SiC module in comparison with a Si-IGBT/Si-FWD module. A three-phase inverter circuit consisted of the SiC module was assembled and stably drove a 3.7 kW/400 V induction motor
Keywords :
avalanche breakdown; power MOSFET; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; 1.2 kV; 1.35 kV; 150 C; 3.7 kW; 400 V; MOSFET; SiC; avalanche breakdown; electrical characteristics; epilayer channel configuration; induction motor; power modules; three-phase inverter circuit; Avalanche breakdown; Circuits; Electric variables; Energy loss; Inverters; MOSFETs; Multichip modules; Prototypes; Silicon carbide; Temperature dependence;
Conference_Titel :
Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on
Conference_Location :
Naples
Print_ISBN :
0-7803-9714-2
DOI :
10.1109/ISPSD.2006.1666121